# smartctl -a /dev/sdd
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital RE Serial ATA
Device Model: WDC WD3200YS-01PGB0
Serial Number: WD-WCAPD2219594
Firmware Version: 21.00M21
User Capacity: 320.072.933.376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sat Apr 25 14:32:55 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9600) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 111) minutes.
Conveyance self-test routine
recommended polling time: ( 6) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 2735
3 Spin_Up_Time 0x0003 186 183 021 Pre-fail Always - 5700
4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2128
5 Reallocated_Sector_Ct 0x0033 104 104 140 Pre-fail Always FAILING_NOW 763
7 Seek_Error_Rate 0x000f 200 093 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 024 024 000 Old_age Always - 55627
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2112
194 Temperature_Celsius 0x0022 110 001 000 Old_age Always - 40
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 763
197 Current_Pending_Sector 0x0012 200 186 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 186 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 2756
200 Multi_Zone_Error_Rate 0x0009 042 001 051 Pre-fail Offline FAILING_NOW 6754
SMART Error Log Version: 1
ATA Error Count: 2708 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2708 occurred at disk power-on lifetime: 55604 hours (2316 days + 20 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 68 13 bb e0 Error: UNC 8 sectors at LBA = 0x00bb1368 = 12260200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 68 13 bb 17 00 29d+19:34:41.972 READ DMA EXT
27 00 00 00 00 00 00 00 29d+19:34:41.971 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 29d+19:34:41.963 IDENTIFY DEVICE
ef 03 45 00 00 00 00 00 29d+19:34:41.956 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 29d+19:34:41.955 READ NATIVE MAX ADDRESS EXT
Error 2707 occurred at disk power-on lifetime: 55604 hours (2316 days + 20 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 68 13 bb e0 Error: UNC 8 sectors at LBA = 0x00bb1368 = 12260200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 68 13 bb 17 00 29d+19:34:40.089 READ DMA EXT
27 00 00 00 00 00 00 00 29d+19:34:40.089 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 29d+19:34:40.081 IDENTIFY DEVICE
ef 03 45 00 00 00 00 00 29d+19:34:40.073 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 29d+19:34:40.073 READ NATIVE MAX ADDRESS EXT
Error 2706 occurred at disk power-on lifetime: 55604 hours (2316 days + 20 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 68 13 bb e0 Error: UNC 8 sectors at LBA = 0x00bb1368 = 12260200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 68 13 bb 17 00 29d+19:34:38.019 READ DMA EXT
27 00 00 00 00 00 00 00 29d+19:34:38.019 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 29d+19:34:38.011 IDENTIFY DEVICE
ef 03 45 00 00 00 00 00 29d+19:34:38.003 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 29d+19:34:38.003 READ NATIVE MAX ADDRESS EXT
Error 2705 occurred at disk power-on lifetime: 55604 hours (2316 days + 20 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 68 13 bb e0 Error: UNC 8 sectors at LBA = 0x00bb1368 = 12260200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 68 13 bb 17 00 29d+19:34:36.129 READ DMA EXT
27 00 00 00 00 00 00 00 29d+19:34:36.129 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 29d+19:34:36.121 IDENTIFY DEVICE
ef 03 45 00 00 00 00 00 29d+19:34:36.113 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 29d+19:34:36.113 READ NATIVE MAX ADDRESS EXT
Error 2704 occurred at disk power-on lifetime: 55604 hours (2316 days + 20 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 68 13 bb e0 Error: UNC 8 sectors at LBA = 0x00bb1368 = 12260200
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 68 13 bb 17 00 29d+19:34:33.875 READ DMA EXT
27 00 00 00 00 00 00 00 29d+19:34:33.875 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 29d+19:34:33.868 IDENTIFY DEVICE
ef 03 45 00 00 00 00 00 29d+19:34:33.867 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 00 00 29d+19:34:33.867 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
smartctl -a /dev/sdX
smartctl -a /dev/sdb
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