K
Klaus-DK
Guest
Ich habe mal ein frage zum SMART Festplattenstatus,
Status des Laufwerkes /dev/sdb meldet einen Fehler,
leider finde ich keine Bedeutung zu diesen Fehler, kann mir bitte
hier einer erklären was dieser Fehler Bedeutet, und ob es nötig ist die Festplatte zu wechseln.
Gruss
Klaus
Status des Laufwerkes /dev/sdb meldet einen Fehler,
leider finde ich keine Bedeutung zu diesen Fehler, kann mir bitte
hier einer erklären was dieser Fehler Bedeutet, und ob es nötig ist die Festplatte zu wechseln.
Code:
smartctl version 5.38 [x86_64-unknown-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: WDC WD10EARS-00Y5B1
Serial Number: WD-WMAV51311160
Firmware Version: 80.00A80
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon Sep 27 19:52:07 2010 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 249) Self-test routine in progress...
90% of test remaining.
Total time to complete Offline
data collection: (20100) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 231) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3031) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 130 130 021 Pre-fail Always - 6483
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 24
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 4360
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 22
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 21
193 Load_Cycle_Count 0x0032 199 199 000 Old_age Always - 4546
194 Temperature_Celsius 0x0022 104 085 000 Old_age Always - 43
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 01 30 4f c2 a0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d6 01 be 4f c2 a0 02 00:01:20.007 SMART WRITE LOG
b0 da 01 00 4f c2 a0 02 00:01:19.922 SMART RETURN STATUS
80 44 00 00 44 57 a0 02 00:01:19.922 [VENDOR SPECIFIC]
b0 d6 01 be 4f c2 a0 02 00:01:19.900 SMART WRITE LOG
80 45 00 01 44 57 a0 02 00:01:19.900 [VENDOR SPECIFIC]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 489 -
# 2 Extended offline Completed without error 00% 129 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delayKlaus
